The effect of thermal fluctuations in Josephson junctions is usually analysed using the Ambegaokar-Halperin (AH) theory in the context of thermal activation. Enhanced fluctuations, demonstrated by broadening of current-voltage characteristics, have previously been found for proximity Josephson junctions. Here we report measurements of micron-scale normal metal loops contacted with thin superconducting electrodes, where the unconventional loop geometry enables tuning of the junction barrier with applied flux; for some geometries, the barrier can be effectively eliminated. Stronger fluctuations are observed when the flux threading the normal metal loop is near an odd half-integer flux quantum, and for devices with thinner superconducting electrodes. These findings suggest that the activation barrier, which is the Josephson coupling energy of the proximity junction, is different from that of conventional Josephson junctions. Simple one dimensional quasiclassical theory can predict the interference effect due to the loop structure, but the exact magnitude of the coupling energy cannot be computed without taking into account the details of the sample dimensions. In this way, the physics of this system is similar to the phase slipping process in thin superconducting wires. Besides shedding light on thermal fluctuations in proximity junctions, the findings here also demonstrate a new type of superconducting interference device with two normal branches sharing the same SN interface on both sides of the device, which has technical advantages for making symmetrical interference devices.
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