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Register a new userTerahertz Radiation Detection by Field Effect Transistor in Magnetic Field
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We report on terahertz radiation detection with InGaAs/InAlAs Field Effect Transistors in quantizing magnetic field. The photovoltaic detection signal is investigated at 4.2 K as a function of the gate voltage and magnetic field. Oscillations analogous to the Shubnikov-de Haas oscillations, as well as their strong enhancement at the cyclotron resonance, are observed. The results are quantitatively described by a recent theory, showing that the detection is due to rectification of the terahertz radiation by plasma waves related nonlinearities in the gated part of the channel.
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Within the two antenna model, we develop a theory of the recently observed helicity-sensitive detection of terahertz radiation by FETs. The effect arises because of the mixing of the ac signals produced in the channel by the two antennas. We calculate the helicity-dependent part of the photoresponse and its dependence on the antenna impedance, gate length, and gate voltage.
This is a brief overview of the main physical ideas for application of field effect transistors for generation and detection of TeraHertz radiation. Resonant frequencies of the two-dimensional plasma oscillations in FETs increase with the reduction of the channel dimensions and reach the THz range for sub-micron gate lengths. When the mobility is high enough, the dynamics of a short channel FET at THz frequencies is dominated by plasma waves. This may result, on the one hand, in a spontaneous generation of plasma waves by a dc current and on the other hand, in a resonant response to the incoming radiation. In the opposite case, when plasma oscillations are overdamped, the FET can operate as an efficient broadband THz detector.
We have fabricated a grating-gate InGaAs/GaAs field-effect transistor structure with narrow slits between the grating gate fingers. The resonant photoconductive response of this structure has been measured in the sub-terahertz frequency range. The frequencies of the photoresponse peaks correspond to the excitation of the plasmon resonances in the structure channel. The obtained responsivity exceeds the responsivity reported previously for similar plasmonic terahertz detectors by two orders of magnitude due to enhanced coupling between incoming terahertz radiation and plasmon oscillations in the slit-grating-gate field-effect transistor structure.
Detectors of high-frequency radiation based on high-electron-mobility transistors benefit from low noise, room-temperature operation, and the possibility to perform radiation spectroscopy using gate-tunable plasmon resonance. Despite successful proof-of-concept demonstrations, the responsivity of transistor-based detectors of THz radiation, at present, remains fairly poor. To resolve this problem, we propose a class of devices supporting singular plasmon modes, i.e. modes with strong electric fields near keen electrodes. A large plasmon-enhanced electric field results in amplified non-linearities, and thus efficient ac-to-dc conversion. We analyze sub-terahertz detectors based on a two-dimensional electron system (2DES) in the Corbino geometry as a prototypical and exactly solvable model and show that the responsivity scales as $1/r_0^{2}$ with the radius of the inner contact $r_0$. This enables responsivities exceeding 10 kV/W at sub-THz frequencies for nanometer-scale contacts readily accessible by modern nanofabrication techniques.
The dielectric engineered tunnel field-effect transistor (DE-TFET) as a high performance steep transistor is proposed. In this device, a combination of high-k and low-k dielectrics results in a high electric field at the tunnel junction. As a result a record ON-current of about 1000 uA/um and a subthreshold swing (SS) below 20mV/dec are predicted for WTe2 DE-TFET. The proposed TFET works based on a homojunction channel and electrically doped contacts both of which are immune to interface states, dopant fluctuations, and dopant states in the band gap which typically deteriorate the OFF-state performance and SS in conventional TFETs.
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