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Register a new userA versatile and reliably re-usable ultrahigh vacuum viewport
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We present a viewport for use in Ultra-high vacuum (UHV) based upon the preflattened solder seal design presented in earlier work, Cox et al. Rev. Sci. Inst. 74, 3185 (2003). The design features significant modifications to improve long term performance. The windows have been leak tested to less than 10^-10 atm cm^3/s . From atom number measurements in an optical dipole trap loaded from a vapor cell magneto-optical trap (MOT) inside a vacuum chamber accommodating these viewports, we measure a trap lifetime of 9.5s suggesting a pressure of around 10^-10 Torr limited by background Rubidium vapor pressure. We also present a simplified design where the UHV seal is made directly to a vacuum pipe
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A cold atom interferometer is being developed using 85Rb atoms towards a search for the dark contents of the vacuum, and as a test stand for inertial sensing applications. Here we outline the current status of the experiment and report the observation of Ramsey interference fringes in the apparatus.
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For one PCB trace region, where bare high voltage trace goes near GND pad, we estimated an electrical breakdown voltage in low vacuum using simplified geometrical model under some assumptions. Experimental measurement of Paschen curve for the PCB board considered was proceed in pressure range from 2x10-3 mbar to 25 mbar.
Entangled states can be used as secure carriers of information much in the same way as carriers are used in classical communications. In such protocols, quantum states are uploaded to the carrier at one end and are downloaded from it in safe form at the other end, leaving the carrier intact and ready for reuse. Furthermore, protocols have been designed for performing quantum state sharing in this way. In this work, we study the robustness of these protocols against noise and show that multiple uses of these carriers do not lead to accumulative errors, rather the error remains constant and under control.
Acquisition and analysis of time-tagged events is a ubiquitous tool in scientific and industrial applications. With increasing time resolution, number of input channels, and acquired events, the amount of data can be overwhelming for standard processing techniques. We developed the Extensible Time-tag Analyzer (ETA), a powerful and versatile, yet easy to use software to efficiently analyze and display time-tagged data. Our tool allows for flexible extraction of correlation from time-tagged data beyond start-stop measurements that were traditionally used. A combination of state diagrams and simple code snippets allows for analysis of arbitrary complexity while keeping computational efficiency high.
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