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Register a new userScanning tunneling microscopy and kinetic Monte Carlo investigation of Cesium superlattices on Ag(111)
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Added by
J\\\"org Kr\\\"oger
Publication date
2008
fields
Physics
and research's language is
English
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Cesium adsorption structures on Ag(111) were characterized in a low-temperature scanning tunneling microscopy experiment. At low coverages, atomic resolution of individual Cs atoms is occasionally suppressed in regions of an otherwise hexagonally ordered adsorbate film on terraces. Close to step edges Cs atoms appear as elongated protrusions along the step edge direction. At higher coverages, Cs superstructures with atomically resolved hexagonal lattices are observed. Kinetic Monte Carlo simulations model the observed adsorbate structures on a qualitative level.
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A growth model and parameters obtained in our previous experimental (scanning tunneling microscopy, KMC) and theoretical (kinetic Monte Carlo simulations, KMC) studies of Ag/Si(111)-(7x7) heteroepitaxy were used to optimise growth conditions (temperature and deposition rate) for the most ordered self-organized growth of Ag island arrays on the (7x7) reconstructed surface. The conditions were estimated by means of KMC simulations using the preference in occupation of half unit cells (HUCs) of F-type as a criterion of island ordering. Morphology of experimentally prepared island structures was studied by STM. High degree of experimentally obtained island ordering is compared with the simulated data and results are discussed with respect to the model and parameters used at the KMC simulations.
The reliability of kinetic Monte Carlo (KMC) simulations depends on accurate transition rates. The self-learning KMC method (Trushin et al 2005 Phys. Rev. B 72 115401) combines the accuracy of rates calculated from a realistic potential with the efficiency of a rate catalog, using a pattern recognition scheme. This work expands the original two-dimensional method to three dimensions. The concomitant huge increase in the number of rate calculations on the fly needed can be avoided by setting up an initial database, containing exact activation energies calculated for processes gathered from a simpler KMC model. To provide two representative examples, the model is applied to the diffusion of Ag monolayer islands on Ag(111), and the homoepitaxial growth of Ag on Ag(111) at low temperatures.
A simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si(111)-7x7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.
We compare STM investigations on two hexaboride compounds, SmB$_6$ and EuB$_6$, in an effort to provide a comprehensive picture of their surface structural properties. The latter is of particular importance for studying the nature of the surface states in SmB$_6$ by surface-sensitive tools. Beyond the often encountered atomically rough surface topographies of {it in situ}, low-temperature cleaved samples, differently reconstructed as well as B-terminated and, more rarely, rare-earth terminated areas could be found. With all the different surface topographies observed on both hexaborides, a reliable assignment of the surface terminations can be brought forward.
Epitaxial graphene grown on transition metal surfaces typically exhibits a moire pattern due to the lattice mismatch between graphene and the underlying metal surface. We use both scanning tunneling microscopy (STM) and atomic force microscopy (AFM) experiments to probe the electronic and topographic contrast of the graphene moire on the Ir(111) surface. While STM topography is influenced by the local density of states close to the Fermi energy and the local tunneling barrier height, AFM is capable of yielding the true surface topography once the background force arising from the van der Waals (vdW) interaction between the tip and the substrate is taken into account. We observe a moire corrugation of 35$pm$10 pm, where the graphene-Ir(111) distance is the smallest in the areas where the graphene honeycomb is atop the underlying iridium atoms and larger on the fcc or hcp threefold hollow sites.
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