An innovative X-ray imaging sensor with intrinsic digital characteristics is presented. It is based on Chromatic Photon Counting technology. The detector is able to count individually the incident X-ray photons and to separate them according to their energy (two color images per exposure). The energy selection occurs in real time and at radiographic imaging speed (GHz global counting rate). Photon counting, color mode and a very high spatial resolution (more than 10 l.p./mm at MTF50) allow to obtain an optimal ratio between image quality and absorbed dose. The individual block of the imaging system is a two-side buttable semiconductor radiation detector made of a thin pixellated CdTe crystal (the sensor) coupled to a large area VLSI CMOS pixel ASIC. 1, 2, 4, 8 tile units have been built. The 8 tiles unit has 25cm x 2.5cm sensitive area. Results and images obtained from in depth testing of several configurations of the system are presented. The X-Ray imaging system is the technological platform of PIXIRAD Imaging Counters s.r.l., a recently constituted INFN spin-off company.
The Gas Pixel Detector, recently developed and continuously improved by Pisa INFN in collaboration with IASF-Roma of INAF, can visualize the tracks produced within a low Z gas by photoelectrons of few keV. By reconstructing the impact point and the original direction of the photoelectrons, the GPD can measure the linear polarization of X-rays, while preserving the information on the absorption point, the energy and the time of individual photons. Applied to X-ray Astrophysics, in the focus of grazing incidence telescopes, it can perform angular resolved polarimetry with a huge improvement of sensitivity, when compared with the conventional techniques of Bragg diffraction at 45 degrees and Compton scattering around 90 degrees. This configuration is the basis of POLARIX and HXMT, two pathfinder missions, and is included in the baseline design of IXO, the very large X-ray telescope under study by NASA, ESA and JAXA.
