اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدDesign and performance of coded aperture optical elements for the CESR-TA x-ray beam size monitor
442
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
We describe the design and performance of optical elements for an x-ray beam size monitor (xBSM), a device measuring $e^+$ and $e^-$ beam sizes in the CESR-TA storage ring. The device can measure vertical beam sizes of $10-100~mu$m on a turn-by-turn, bunch-by-bunch basis at $e^pm$ beam energies of $sim2-5~$GeV. X-rays produced by a hard-bend magnet pass through a single- or multiple-slit (coded aperture) optical element onto a detector. The coded aperture slit pattern and thickness of masking material forming that pattern can both be tuned for optimal resolving power. We describe several such optical elements and show how well predictions of simple models track measured performances.
قيم البحث
اقرأ أيضاً
We describe the construction and operation of an x-ray beam size monitor (xBSM), a device measuring $e^+$ and $e^-$ beam sizes in the CESR-TA storage ring using synchrotron radiation. The device can measure vertical beam sizes of $10-100~mu$m on a tu
rn-by-turn, bunch-by-bunch basis at $e^pm$ beam energies of $sim2~$GeV. At such beam energies the xBSM images x-rays of $epsilonapprox$1-10$~$keV ($lambdaapprox 0.1-1$ nm) that emerge from a hard-bend magnet through a single- or multiple-slit (coded aperture) optical element onto an array of 32 InGaAs photodiodes with 50$~mu$m pitch. Beamlines and detectors are entirely in-vacuum, enabling single-shot beam size measurement down to below 0.1$~$mA ($2.5times10^9$ particles) per bunch and inter-bunch spacing of as little as 4$~$ns. At $E_{rm b}=2.1 $GeV, systematic precision of $sim 1~mu$m is achieved for a beam size of $sim12~mu$m; this is expected to scale as $propto 1/sigma_{rm b}$ and $propto 1/E_{rm b}$. Achieving this precision requires comprehensive alignment and calibration of the detector, optical elements, and x-ray beam. Data from the xBSM have been used to extract characteristics of beam oscillations on long and short timescales, and to make detailed studies of low-emittance tuning, intra-beam scattering, electron cloud effects, and multi-bunch instabilities.
We developed an electron beam size monitor for extremely small beam sizes. It uses a laser interference fringe for a scattering target with the electron beam. Our target performance is < 2 nm systematic error for 37 nm beam size and < 10% statistical
error in a measurement using 90 electron bunches for 25 - 6000 nm beam size. A precise laser interference fringe control system using an active feedback function is incorporated to the monitor to achieve the target performance. We describe an overall design, implementations, and performance estimations of the monitor.
We describe operation of the CESR-TA vertical beam size monitor (xBSM) with $e^pm$ beams with $E_{rm b}$=4 GeV. The xBSM measures vertical beam size by imaging synchrotron radiation x-rays through an optical element onto a detector array of 32 InGaAs
photodiodes with 50 $mu$m pitch. The device has previously been successfully used to measure vertical beam sizes of 10-100 $mu$m on a bunch-by-bunch, turn-by-turn basis at $e^pm$ beam energies of $sim$2 GeV and source magnetic fields below 2.8 kG, for which the detector required calibration for incident x-rays of 1-5 keV. At $E_{rm b}=4.0$ GeV and $B$=4.5 kG, however, the incident synchrotron radiation spectrum extends to $sim$20 keV, requiring calibration of detector response in that regime. Such a calibration is described and then used to analyze data taken with several different thicknesses of filters in front of the detector. We obtain a relative precision of better than 4% on beam size measurement from 15-100 $mu$m over several different ranges of x-ray energy, including both 1-12 keV and 6-17 keV. The response of an identical detector, but tilted vertically by 60$^circ$ in order to increase magnfication without a longer beamline, is measured and shown to improve x-ray detection above 4 keV without compromising sensitivity to beam size. We also investigate operation of a coded aperture using gold masking backed by synthetic diamond.
Diagnosing free electron laser (FEL) polarization is critical for polarization-modulated research such as x-ray free electron laser (XFEL) diffraction imaging and probing material magnetism. In an electron time-of-flight (eTOF) polarimeter, the fligh
t time and angular distribution of photoelectrons were designed based on x-ray polarimetry for on-site diagnosis. However, the transverse position of x-ray FEL pulses introduces error into the measured photoelectron angular distribution. This work thus proposes a method to monitor the transverse position using an eTOF polarimeter and explains how to compensate for the error due to transverse position. A comprehensive numerical model is developed to demonstrate the feasibility of the compensation method, and the results reveal that a spatial resolution of 20 (mu)m and a polarity improved by 0.5% is possible with fully polarized FEL pulses. The impact of FEL pulses and a method to calibrate their linearity is also discussed.
The CMS beam and radiation monitoring subsystem BCM1F (Fast Beam Condition Monitor) consists of 8 individual diamond sensors situated around the beam pipe within the pixel detector volume, for the purpose of fast bunch-by-bunch monitoring of beam bac
kground and collision products. In addition, effort is ongoing to use BCM1F as an online luminosity monitor. BCM1F will be running whenever there is beam in LHC, and its data acquisition is independent from the data acquisition of the CMS detector, hence it delivers luminosity even when CMS is not taking data. A report is given on the performance of BCM1F during LHC run I, including results of the van der Meer scan and on-line luminosity monitoring done in 2012. In order to match the requirements due to higher luminosity and 25 ns bunch spacing, several changes to the system must be implemented during the upcoming shutdown, including upgraded electronics and precise gain monitoring. First results from Run II preparation are shown.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
