ترغب بنشر مسار تعليمي؟ اضغط هنا

A study of the mechanisms of the semi-insulating conversion of InP by anelastic spectroscopy

58   0   0.0 ( 0 )
 نشر من قبل Francesco Cordero
 تاريخ النشر 1999
  مجال البحث فيزياء
والبحث باللغة English
 تأليف R. Cantelli




اسأل ChatGPT حول البحث

Elastic energy absorption measurements versus temperature on semiconducting, semi-insulating (SI) and Fe-doped InP are reported. A thermally activated relaxation process is found only in the SI state, which is identified with the hopping of H atoms trapped at In vacancies. It is proposed that the presence of In vacancies in InP prepared by the liquid encapsulated Czochralski method is due to the lowering of their energy by the saturation of the P dangling bonds with H atoms dissolved from the capping liquid containing H2O. The conversion of iron-free InP to the SI state following high temperature treatments would be due to H loss with the transformation of the H-saturated In vacancies, V_In-H_4 donors, into neutral and acceptor V_In-H_n complexes with n < 4. Such complexes would produce the observed anelastic relaxation process and may also act as deep acceptors which neutralize unwanted donor impurities.



قيم البحث

اقرأ أيضاً

The charge dynamics of hydrogen-like centers formed by the implantation of energetic (4 MeV) muons in semi-insulating GaAs have been studied by muon spin resonance in electric fields. The results point to the significant role of deep hole traps in th e compensation mechanism of GaAs. Electric-field-enhanced neutralization of deep electron and hole traps by muon-track-induced hot carriers results to an increase of the non-equilibrium carrier life-times. As a consequence, the muonium ($mu^+ + e^-$) center at the tetrahedral As site can capture the tracks holes and therefore behaves like a donor.
Using time-resolved $1s$-$2p$ excitonic Lyman spectroscopy, we study the orthoexciton-to-paraexcitons transfer, following the creation of a high density population of ultracold $1s$ orthoexcitons by resonant two-photon excitation with femtosecond pul ses. An observed fast exciton-density dependent conversion rate is attributed to spin exchange between pairs of orthoexcitons. Implication of these results on the feasibility of BEC of paraexcitons in Cu$_2$O is discussed.
230 - C. P. Weber , Craig A. Benko , 2011
We use optical transient-grating spectroscopy to measure spin diffusion of optically oriented electrons in bulk, semi-insulating GaAs(100). Trapping and recombination do not quickly deplete the photoexcited population. The spin diffusion coefficient of 88 +/- 12 cm2/s is roughly constant at temperatures from 15 K to 150 K, and the spin diffusion length is at least 450 nm. We show that it is possible to use spin diffusion to estimate the electron diffusion coefficient. Due to electron-electron interactions, the electron diffusion is 1.4 times larger than the spin diffusion.
Enhanced polarization conversion in reflection for the Otto and Kretschmann configurations is introduced as a new method for hybrid-mode spectroscopy. Polarization conversion in reflection appears when hybrid-modes are excited in a guiding structure composed of at least one anisotropic media. In contrast to a dark dip, in this case modes are associated to a peak in the converted reflectance spectrum, increasing the detection sensitivity and avoiding confusion with reflection dips associated with other processes as can be transmission.
The combination of core/shell geometry and band gap engineering in nanowire heterostructures can be employed to realize systems with novel transport and optical properties. Here, we report on the growth of InAs/InP/GaAsSb core-dual-shell nanowires by catalyst-free chemical beam epitaxy on Si(111) substrates. Detailed morphological, structural, and compositional analyses of the nanowires as a function of growth parameters were carried out by scanning and transmission electron microscopy and by energy-dispersive X-ray spectroscopy. Furthermore, by combining the scanning transmission electron microscopy-Moire technique with geometric phase analysis, we studied the residual strain and the relaxation mechanisms in this system. We found that InP shell facets are well-developed along all the crystallographic directions only when the nominal thickness is above 1 nm, suggesting an island-growth mode. Moreover, the crystallographic analysis indicates that both InP and GaAsSb shells grow almost coherently to the InAs core along the 112 direction and elastically compressed along the 110 direction. For InP shell thickness above 8 nm, some dislocations and roughening occur at the interfaces. This study provides useful general guidelines for the fabrication of high-quality devices based on these core-dual-shell nanowires.
التعليقات
جاري جلب التعليقات جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
mircosoft-partner

هل ترغب بارسال اشعارات عن اخر التحديثات في شمرا-اكاديميا