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It has been proposed and demonstrated that path-entangled Fock states (PEFSs) are robust against photon loss over NOON states [S. D. Huver emph{et al.}, Phys. Rev. A textbf{78}, 063828 (2008)]. However, the demonstration was based on a measurement scheme which was yet to be implemented in experiments. In this work, we quantitatively illustrate the advantage of PEFSs over NOON states in the presence of photon losses by analytically calculating the quantum Fisher information. To realize such an advantage in practice, we then investigate the achievable sensitivities by employing three types of feasible measurements: parity, photon-number-resolving, and homodyne measurements. We here apply a double-port measurement strategy where the photons at each output port of the interferometer are simultaneously detected with the aforementioned types of measurements.
We investigate the utility of parity detection to achieve Heisenberg-limited phase estimation for optical interferometry. We consider the parity detection with several input states that have been shown to exhibit sub shot-noise interferometry with th
We propose a class of path-entangled photon Fock states for robust quantum optical metrology, imaging, and sensing in the presence of loss. We model propagation loss with beam-splitters and derive a reduced density matrix formalism from which we exam
We study how useful random states are for quantum metrology, i.e., surpass the classical limits imposed on precision in the canonical phase estimation scenario. First, we prove that random pure states drawn from the Hilbert space of distinguishable p
The impact of measurement imperfections on quantum metrology protocols has been largely ignored, even though these are inherent to any sensing platform in which the detection process exhibits noise that neither can be eradicated, nor translated onto
We analyze simultaneous quantum estimations of multiple parameters with postselection measurements in terms of a tradeoff relation. The system, or a sensor, is characterized by a set of parameters, interacts with a measurement apparatus (MA), and the