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تسجيل مستخدم جديدTransverse Kerker Scattering for Angstrom Localization of Nanoparticles
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Angstrom precision localization of a single nanoantenna is a crucial step towards advanced nanometrology, medicine and biophysics. Here, we show that single nanoantenna displacements down to few Angstroms can be resolved with sub-Angstrom precision using an all-optical method. We utilize the tranverse Kerker scattering scheme where a carefully structured light beam excites a combination of multipolar modes inside a dielectric nanoantenna, which then upon interference, scatters directionally into the far-field. We spectrally tune our scheme such that it is most sensitive to the change in directional scattering per nanoantenna displacement. Finally, we experimentally show that antenna displacement down to 3 Angstrom is resolvable with a localization precision of 0.6 Angstrom.
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Transverse Kerker effect is known by the directional scattering of an electromagnetic plane wave perpendicular to the propagation direction with nearly suppression of both forward and backward scattering. Compared with plane waves, localized electrom
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