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We consider non-adaptive threshold group testing for identification of up to $d$ defective items in a set of $n$ items, where a test is positive if it contains at least $2 leq u leq d$ defective items, and negative otherwise. The defective items can be identified using $t = O left( left( frac{d}{u} right)^u left( frac{d}{d - u} right)^{d-u} left(u log{frac{d}{u}} + log{frac{1}{epsilon}} right) cdot d^2 log{n} right)$ tests with probability at least $1 - epsilon$ for any $epsilon > 0$ or $t = O left( left( frac{d}{u} right)^u left( frac{d}{d -u} right)^{d - u} d^3 log{n} cdot log{frac{n}{d}} right)$ tests with probability 1. The decoding time is $t times mathrm{poly}(d^2 log{n})$. This result significantly improves the best known results for decoding non-adaptive threshold group testing: $O(nlog{n} + n log{frac{1}{epsilon}})$ for probabilistic decoding, where $epsilon > 0$, and $O(n^u log{n})$ for deterministic decoding.
The goal of threshold group testing is to identify up to $d$ defective items among a population of $n$ items, where $d$ is usually much smaller than $n$. A test is positive if it has at least $u$ defective items and negative otherwise. Our objective
We consider an efficiently decodable non-adaptive group testing (NAGT) problem that meets theoretical bounds. The problem is to find a few specific items (at most $d$) satisfying certain characteristics in a colossal number of $N$ items as quickly as
The basic goal of threshold group testing is to identify up to $d$ defective items among a population of $n$ items, where $d$ is usually much smaller than $n$. The outcome of a test on a subset of items is positive if the subset has at least $u$ defe
We will discuss superimposed codes and non-adaptive group testing designs arising from the potentialities of compressed genotyping models in molecular biology. The given paper was motivated by the 30th anniversary of Dyachkov-Rykov recurrent upper bo
In this paper, we consider the problem of noiseless non-adaptive probabilistic group testing, in which the goal is high-probability recovery of the defective set. We show that in the case of $n$ items among which $k$ are defective, the smallest possi