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تسجيل مستخدم جديدConstruction of Triple-GEM Detectors Using Commercially Manufactured Large GEM Foils
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Many experiments are currently using or proposing to use large area GEM foils in their detectors, which is creating a need for commercially available GEM foils. Currently CERN is the only main distributor of large GEM foils, however with the growing interest in GEM technology keeping up with the increasing demand for GEMs will be difficult. Thus the commercialization of GEMs up to 50 $times$ 50 cm$^2$ has been established by Tech-Etch Inc. of Plymouth, MA, USA using the single-mask technique. The electrical performance and optical quality of the single-mask GEM foils have been found to be on par with those produced by CERN. The next critical step towards validating the Tech-Etch single-mask GEM foils is to test their performance under physics conditions. These measurements will allow us to quantify and compare the gain and efficiency of the detector to other triple-GEM detectors. This will be done by constructing several single-mask triple-GEM detectors, using foils manufactured by Tech-Etch, which follow the design used by the STAR Forward GEM Tracker (FGT). These detectors will investigate ways in which to further decrease the material budget and increase the efficiency of the detector by incorporating perforated Kapton spacer rings rather than G10 spacing grids to reduce the dead area of the detector. The materials and tooling needed to assemble the triple-GEM detectors have been acquired. The GEM foils have been electrically tested, and a handful have been optically scanned. We found these results to be consistent with GEM foils produced by CERN. With the success of these initial tests, construction of the triple-GEM detectors is now under way.
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Many experiments are currently using or proposing to use large area GEM foils in their detectors, which is creating a need for commercially available GEM foils. Currently CERN is the only main distributor of large GEM foils, however with the growing
interest in GEM technology keeping up with the increasing demand for GEMs will be difficult. We present here an update on the assembly and testing of triple-GEM tracking detectors utilizing single-masked $40 times 40$ cm$^2$ commercial GEM foils produced by Tech-Etch. The triple-GEM detectors will allow us to characterize the overall quality of these Tech-Etch foils through gain, efficiency, and energy resolution measurements. This will be done by constructing four single-mask triple-GEM detectors, using foils manufactured by Tech-Etch, which follow the design used by the STAR Forward GEM Tracker (FGT). The stack is formed by gluing the foils to the frames and then gluing the frames together. The stack also includes a Tech-Etch produced high voltage foil and a 2D $r-phi$ readout foil. While one of the four triple-GEM detectors will be built identically to the STAR FGT, the other three will investigate ways in which to further decrease the material budget and increase the efficiency of the detector by incorporating perforated Kapton spacer rings rather than G10 spacing grids to reduce the dead area of the detector.
Many experiments are currently using or proposing to use large area GEM foils in their detectors, which is creating a need for commercially available GEM foils. Currently CERN is the only main distributor of GEM foils, however with the growing intere
st in GEM technology keeping up with the increasing demand for GEM foils will be difficult. Thus the commercialization of GEM foils has been established by Tech-Etch Inc. of Plymouth, MA, USA using the single-mask technique, which is capable of producing GEM foils over a meter long. To date Tech-Etch has successfully manufactured 10 $times$ 10 cm$^2$ and 40 $times$ 40 cm$^2$ GEM foils. We will report on the electrical and geometrical properties, along with the inner and outer hole diameter size uniformity of these foils. Furthermore, Tech-Etch has now begun producing even larger GEM foils of 50 $times$ 50 cm$^2$, and are currently looking into how to accommodate GEM foils on the order of one meter long. The Tech-Etch foils were found to have excellent electrical properties. The measured mean optical properties were found to reflect the desired parameters and are consistent with those measured in double-mask GEM foils, as well as single-mask GEM foils produced at CERN. They also show good hole diameter uniformity over the active area.
With future experiments proposing detectors that utilize very large-area GEM foils, there is a need for commercially available GEM foils. Double-mask etching techniques pose a clear limitation in the maximum size of GEM foils. In contrast, single-mas
k techniques developed at CERN would allow one to overcome those limitations. However with interest in GEM foils increasing and CERN being the only main distributor, keeping up with the demand for GEM foils will be difficult. Thus the commercialization of GEMs has been established by Tech-Etch of Plymouth, MA, USA using single-mask techniques. We report on the electrical and geometrical properties, along with the inner and outer hole diameter size uniformity of 10 $times$ 10 cm$^2$ and 40$times$40 cm$^2$ GEM foils. The Tech-Etch foils were found to have excellent electrical properties. The measured mean optical properties were found to reflect the desired parameters and are consistent with those measured in double-mask GEM foils, and show good hole diameter uniformity over the active area. These foils are well suited for future applications in nuclear and particle physics where tracking devices are needed.
The recently completed Forward GEM Tracker (FGT) of the STAR experiment at RHIC took advantage of commercially produced GEM foils based on double-mask chemical etching techniques. With future experiments proposing detectors that utilize very large-ar
ea GEM foils, there is a need for commercially available GEM foils. Double-mask etching techniques pose a clear limitation in the maximum size. In contrast, single-mask techniques developed at CERN would allow one to overcome those limitations. We report on results obtained using 10 $times$ 10 cm$^2$ and 40$times$40 cm$^2$ GEM foils produced by Tech-Etch Inc. of Plymouth, MA, USA using single-mask techniques and thus the beginning for large GEM foil production on a commercial basis. A quality assurance procedure has been established through electrical and optical analyses via leakage current measurements and an automated high-resolution CCD scanner. The Tech-Etch foils show excellent electrical properties with leakage currents typically measured below 1 nA. The geometrical properties of the Tech-Etch single-mask foils were found to be consistent with one another, and were in line with geometrical specifications from previously measured double-mask foils. The single-mask foils displayed good inner and outer hole diameter uniformities over the entire active area.
An analysis software was developed for the high aspect ratio optical scanning system in the Detec- tor Laboratory of the University of Helsinki and the Helsinki Institute of Physics. The system is used e.g. in the quality assurance of the GEM-TPC det
ectors being developed for the beam diagnostics system of the SuperFRS at future FAIR facility. The software was tested by analyzing five CERN standard GEM foils scanned with the optical scanning system. The measurement uncertainty of the diameter of the GEM holes and the pitch of the hole pattern was found to be 0.5 {mu}m and 0.3 {mu}m, respectively. The software design and the performance are discussed. The correlation between the GEM hole size distribution and the corresponding gain variation was studied by comparing them against a detailed gain mapping of a foil and a set of six lower precision control measurements. It can be seen that a qualitative estimation of the behavior of the local variation in gain across the GEM foil can be made based on the measured sizes of the outer and inner holes.
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