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Main focus of this study is the investigation of thermodynamics phenomena responsible for the High Field Q Slope (HFQS) in SRF cavities by Internal Friction (IF) measurement. Mechanical spectroscopy is, indeed, a well-established technique to study precipitate formations in BCC materials and several works on the effects of impurities as N and O on the Snoek peak have been published so far and will be taken as reference to explain the mechanisms behind the observed dissipation effects. Internal Friction measurements were performed in Belgium at IMCE on Nb rectangular shape samples with different RRR values prepared at Fermilab by using Electro Polishing (EP), N-doping and heat treatments in order to reproduce the same conditions during the standard treatments applied on bulk Nb SRF cavities. From IF spectra, the H trapping mechanism by interstitial atoms (N and O and/or vacancies, depending on the purity level, RRR) can be easily recognized leading to results that perfectly corroborate previous findings on Q-disease, HFQS and RRR phenomena.
We report the first evidence of the formation of niobium hydrides within niobium films on silicon substrates in superconducting qubits fabricated at Rigetti Computing. We combine complementary techniques including room and cryogenic temperature atomi
Computing inspired by the human brain requires a massive parallel architecture of low-power consuming elements of which the internal state can be changed. SrTiO3 is a complex oxide that offers rich electronic properties; here Schottky contacts on Nb-
High purity niobium (Nb), subjected to the processing methods used in the fabrication of superconducting RF cavities, displays micron-sized surface patches containing excess carbon. High-resolution transmission electron microscopy and electron energy
We report an investigation of the structural and electronic properties of hybrid superconductor/ferromagnet (S/F) bilayers of composition Nb/Cu$_{60}$Ni$_{40}$ prepared by magnetron sputtering. X-ray and neutron reflectometry show that both the overa
This work reports the strain effect on the electrical properties of highly doped n-type single crystalline cubic silicon carbide (3C-SiC) transferred onto a 6-inch glass substrate employing an anodic bonding technique. The experimental data shows hig