During the semiconductor manufacturing process, predicting the yield of the semiconductor is an important problem. Early detection of defective product production in the manufacturing process can save huge production cost. The data generated from the semiconductor manufacturing process have characteristics of highly non-normal distributions, complicated missing patterns and high missing rate, which complicate the prediction of the yield. We propose Dirichlet process - naive Bayes model (DPNB), a classification method based on the mixtures of Dirichlet process and naive Bayes model. Since the DPNB is based on the mixtures of Dirichlet process and learns the joint distribution of all variables involved, it can handle highly non-normal data and can make predictions for the test dataset with any missing patterns. The DPNB also performs well for high missing rates since it uses all information of observed components. Experiments on various real datasets including semiconductor manufacturing data show that the DPNB has better performance than MICE and MissForest in terms of predicting missing values as percentage of missing values increases.
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