Using near-total-reflection hard X-ray photoelectron spectroscopy for high-resolution depth profiling

By adjusting the incidence angle of incoming X-ray near the critical angle of X-ray total reflection, the photoelectron intensity is strongly modulated due to the variation of X-ray penetration depth. Photoemission spectroscopy (PES) combining with near total reflection (NTR) exhibit tunable surface sensitivity, providing depth-resolved information. In this work, the technique and some recent experimental works using NTR-PES are reviewed. The emphasis is on its applications to correlated oxide heterostructures, especially quantitative depth analyses of compositions and electronic states.