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Polariton-based devices require materials where light-matter coupling under ambient conditions exceeds losses, but our current selection of such materials is limited. Here we measured the dispersion of polaritons formed by the $A$ and $B$ excitons in thin MoS$_2$ slabs by imaging their optical near fields. We combined fully tunable laser excitation in the visible with a scattering near-field optical microscope to excite polaritons and image their optical near fields. We obtained the properties of bulk MoS$_2$ from fits to the slab dispersion. The in-plane excitons are in the strong regime of light-matter coupling with a coupling strength ($40-100,$meV) that exceeds their losses by at least a factor of two. The coupling becomes comparable to the exciton binding energy, which is known as very strong coupling. MoS$_2$ and other transition metal dichalcogenides are excellent materials for future polariton devices.
To translate electrical into optical signals one uses the modulation of either the refractive index or the absorbance of a material by an electric field. Contemporary electroabsorption modulators (EAMs) employ the quantum confined Stark effect (QCSE)
Transition metal dichalcogenides like MoS$_2$, MoSe$_2$, WS$_2$, and WSe$_2$ have attracted enormous interest during recent years. They are van-der-Waals crystals with highly anisotropic properties, which allows exfoliation of individual layers. Thei
Two-dimensional (2D) crystals have renewed opportunities in design and assembly of artificial lattices without the constraints of epitaxy. However, the lack of thickness control in exfoliated van der Waals (vdW) layers prevents realization of repeat
Inversion-symmetric crystals are optically isotropic and thus naively not expected to show dichroism effects in optical absorption and photoemission processes. Here, we find a strong linear dichroism effect (up to 42.4%) in the conduction band of inv
We present an ultra-high vacuum scanning tunneling microscopy (STM) study of structural defects in molybdenum disulfide thin films grown on silicon substrates by chemical vapor deposition. A distinctive type of grain boundary periodically arranged in