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Andreev reflection (AR) refers to the electron-hole conversion at the normal metal-superconductor interface. In a three-dimensional metal with spherical Fermi surface, retro (specular) AR can occur with the sign reversal of all three (a single) components of particle velocity. Here, we predict a novel type of AR with the inversion of two velocity components, dubbed anomalous-trajectory Andreev reflection (AAR), which can be realized in a class of materials with torus-shaped Fermi surface, such as doped nodal line semimetals. For its toroidal circle perpendicular to the interface, the Fermi torus doubles the AR channels and generates multiple AR processes. In particular, the AAR and retro AR are found to dominate electron transport in the light and heavy doping regimes, respectively. We show that the AAR visibly manifests as a ridge structure in the spatially resolved nonlocal conductance, in contrast to the peak structure for the retro AR. Our work opens a new avenue for the AR spectroscopy and offers a clear transport signature of torus-shaped Fermi surface.
The quasi-bound states of a superconducting quantum dot that is weakly coupled to a normal metal appear as resonances in the Andreev reflection probability, measured via the differential conductance. We study the evolution of these Andreev resonances
We propose a universal method to detect the specular Andreev reflection taking the simple two dimensional Weyl nodal-line semimetal-superconductor double-junction structure as an example. The quasiclassical quantization conditions are established for
Using the tight binding model and the non-equilibrium Green function method, we study Andreev reflection in graphene-superconductor junction, where graphene has two nonequal Dirac Cones split in energy and therefore time reversal symmetry is broken.
We report on the results of directional point-contact Andreev-reflection (PCAR) measurements in Ba(Fe_{1-x}Co_x)2As2 single crystals and epitaxial c-axis oriented films with x = 0.08 as well as in Ca(Fe_{1-x}Co_x)2As2 single crystals with x = 0.06. T
Low temperature transport measurements on superconducting film - normal metal wire - superconducting film (SNS) junctions fabricated on the basis of 6 nm thick superconducting polycrystalline PtSi films are reported. The structures with the normal me