There is a long standing technological problem in which a stress dwell during cyclic loading at room temperature in Ti causes a significant fatigue life reduction. It is thought that localised time dependent plasticity in soft grains oriented for easy plastic slip leads to load shedding and an increase in stress within a neighbouring hard grain poorly oriented for easy slip. Quantifying this time dependent plasticity process is key to successfully predicting the complex cold dwell fatigue problem. This work uses a novel approach of in situ synchrotron X-ray diffraction during stress relaxation tests, to quantify the time dependent plasticity. Measured lattice strains from multiple lattice families (21 diffraction rings) were compared with simulated lattice strains from crystal plasticity finite element (CPFE) simulations. The prism slip parameters were found to show stronger strain rate sensitivity compared to basal slip, and this has a significant effect on stress redistribution to hard grain orientations during cold creep.
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