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Since the introduction of bolometers more than a century ago, they have been applied in a broad spectrum of contexts ranging from security and the construction industry to particle physics and astronomy. However, emerging technologies and missions call for faster bolometers with lower noise. Here, we demonstrate a nanobolometer that exhibits roughly an order of magnitude lower noise equivalent power, $20textrm{ zW}/sqrt{textrm{Hz}}$, than previously reported for any bolometer. Importantly, it is more than an order of magnitude faster than other low-noise bolometers, with a time constant of 30 $mu$s at $60textrm{ zW}/sqrt{textrm{Hz}}$. These results suggest a calorimetric energy resolution of $0.3textrm{ zJ}=htimes 0.4$ THz with a time constant of 30 $mu$s. Thus the introduced nanobolometer is a promising candidate for future applications requiring extreme precision and speed such as those in astronomy and terahertz photon counting.
Crystalline optical cavities are the foundation of todays state-of-the-art ultrastable lasers. Building on our previous silicon cavity effort, we now achieve the fundamental thermal noise-limited stability for a 6 cm long silicon cavity cooled to 4 K
We present design and simulation of a Josephson parametric amplifier with bandwidth exceeding 1.6 GHz, and with high saturation power approaching -90 dBm at a gain of 22.8 dB. An improvement by a factor of roughly 50 in bandwidth over the state of th
A precise measurement of dephasing over a range of timescales is critical for improving quantum gates beyond the error correction threshold. We present a metrological tool, based on randomized benchmarking, capable of greatly increasing the precision
We develop Johnson noise thermometry applicable to mesoscopic devices with variable source impedance with high bandwidth for fast data acquisition. By implementing differential noise measurement and two-stage impedance matching, we demonstrate noise
We present the first experimental study of a new type of power recycling microwave interferometer designed for low noise measurements. This system enhances sensitivity to phase fluctuations in a Device Under Test, independent of input power levels. T