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Electromagnetic induction imaging with atomic magnetometers has disclosed unprecedented domains for imaging, from security screening to material characterization. However, applications to low-conductivity specimens -- most notably for biomedical imaging -- require sensitivity, stability, and tunability only speculated thus far. Here, we demonstrate contactless and non-invasive imaging down to 50 S/m using a 50 fT/Hz$^{-1/2}$ $^{87}$Rb radio-frequency atomic magnetometer operating in an unshielded environment and near room temperature. Two-dimensional images of test objects are obtained with a near-resonant imaging approach, which reduces the phase noise by a factor 172, with projected sensitivity of 1 S/m. Our results, an improvement of more than three orders of magnitude on previous imaging demonstrations, push electromagnetic imaging with atomic magnetometers to regions of interest for semiconductors, insulators, and biological tissues.
We demonstrate electromagnetic induction imaging with an unshielded, portable radio-frequency atomic magnetometer scanning over the target object. This configuration satisfies standard requirements in typical applications, from security screening to
We describe our research programme on the use of atomic magnetometers to detect conductive objects via electromagnetic induction. The extreme sensitivity of atomic magnetometers at low frequencies, up to seven orders of magnitude higher than a coil-b
We demonstrate identification of position, material, orientation and shape of objects imaged by an $^{85}$Rb atomic magnetometer performing electromagnetic induction imaging supported by machine learning. Machine learning maximizes the information ex
Atomic comagnetometers, which measure the spin precession frequencies of overlapped species simultaneously, are widely applied to search for exotic spin-dependent interactions. Here we propose and implement an all-optical single-species Cs atomic com
The hot disk transient plane source (TPS) method is a widely used standard technique (ISO 22007-2) for the characterization of thermal properties of materials, especially the thermal conductivity, k. Despite its well-established reliability for a wid