اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدIon-trap measurements of electric-field noise near surfaces
145
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
Electric-field noise near surfaces is a common problem in diverse areas of physics, and a limiting factor for many precision measurements. There are multiple mechanisms by which such noise is generated, many of which are poorly understood. Laser-cooled, trapped ions provide one of the most sensitive systems to probe electric-field noise at MHz frequencies and over a distance range 30 - 3000 $mu$m from the surface. Over recent years numerous experiments have reported spectral densities of electric-field noise inferred from ion heating-rate measurements and several different theoretical explanations for the observed noise characteristics have been proposed. This paper provides an extensive summary and critical review of electric-field noise measurements in ion traps, and compares these experimental findings with known and conjectured mechanisms for the origin of this noise. This reveals that the presence of multiple noise sources, as well as the different scalings added by geometrical considerations, complicate the interpretation of these results. It is thus the purpose of this review to assess which conclusions can be reasonably drawn from the existing data, and which important questions are still open. In so doing it provides a framework for future investigations of surface-noise processes.
قيم البحث
اقرأ أيضاً
Scaling up trapped-ion quantum computers requires new trap materials to be explored. Here, we present experiments with a surface ion trap made from the high-temperature superconductor YBCO, a promising material for future trap designs. We show that v
oltage noise from superconducting electrode leads is negligible within the sensitivity $S_V=9times 10^{-20},mathrm{V}^2mathrm{Hz}^{-1}$ of our setup, and for lead dimensions typical for advanced trap designs. Furthermore, we investigate the frequency and temperature dependence of electric field noise above a YBCO surface. We find a $1/f$ spectral dependence of the noise and a non-trivial temperature dependence, with a plateau in the noise stretching over roughly $60,mathrm{K}$. The onset of the plateau coincides with the superconducting transition, indicating a connection between the dominant noise and the YBCO trap material. We exclude the YBCO bulk as origin of the noise and suggest further experiments to decide between the two remaining options explaining the observed temperature dependence: noise screening within the superconducting phase, or surface noise activated by the YBCO bulk through some unknown mechanism.
We investigate anomalous ion-motional heating, a limitation to multi-qubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multi-zone surface-electrode trap in which ions can be held at five disc
rete distances from the metal electrodes, we measure power-law dependencies of the electric-field noise experienced by the ion on the ion-electrode distance $d$. We find a scaling of approximately $d^{-4}$ regardless of whether the electrodes are at room temperature or cryogenic temperature, despite the fact that the heating rates are approximately two orders of magnitude smaller in the latter case. Through auxiliary measurements using application of noise to the electrodes, we rule out technical limitations to the measured heating rates and scalings. We also measure frequency scaling of the inherent electric-field noise close to $1/f$ at both temperatures. These measurements eliminate from consideration anomalous-heating models which do not have a $d^{-4}$ distance dependence, including several microscopic models of current interest.
We probe electric-field noise near the metal surface of an ion trap chip in a previously unexplored high-temperature regime. We observe a non-trivial temperature dependence with the noise amplitude at 1-MHz frequency saturating around 500~K. Measurem
ents of the noise spectrum reveal a $1/f^{alphaapprox1}$-dependence and a small decrease in $alpha$ between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally-activated two-level fluctuators with activation energies between 0.35~eV and 0.65~eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example defect motion in the solid state and surface adsorbate binding energies. Studying these processes may aid in identifying the origin of excess electric-field noise in ion traps -- a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.
We probe electric-field noise in a surface ion trap for ion-surface distances $d$ between 50 and 300 $mumathrm{m}$ in the normal and planar directions. We find the noise distance dependence to scale as $d^{-2.6}$ in our trap and a frequency dependenc
e which is consistent with $1/f$ noise. Simulations of the electric-field noise specific to our trap geometry provide evidence that we are not limited by technical noise sources. Our distance scaling data is consistent with a noise correlation length of about 100 $mumathrm{m}$ at the trap surface, and we discuss how patch potentials of this size would be modified by the electrode geometry.
We aim to illuminate how the microscopic properties of a metal surface map to its electric-field noise characteristics. In our system, prolonged heat treatments of a metal film can induce a rise in the magnitude of the electric-field noise generated
by the surface of that film. We refer to this heat-induced rise in noise magnitude as a thermal transformation. The underlying physics of this thermal transformation process is explored through a series of heating, milling, and electron treatments performed on a single surface ion trap. Between these treatments, $^{40}$Ca$^+$ ions trapped 70 $mu$m above the surface of the metal are used as detectors to monitor the electric-field noise at frequencies close to 1 MHz. An Auger spectrometer is used to track changes in the composition of the contaminated metal surface. With these tools we investigate contaminant deposition, chemical reactions, and atomic restructuring as possible drivers of thermal transformations. The data suggest that the observed thermal transformations can be explained by atomic restructuring at the trap surface. We hypothesize that a rise in local atomic order increases surface electric-field noise in this system.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
