اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدX-ray scattering of periodic and graded multilayers: comparison of experiments to simulations from surface microroughness characterization
108
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical performance; therefore, it is important to predict the amount of X-ray scattering from the rough topography of the outer surface of the coating, which can be directly measured, e.g., with an Atomic Force Microscope (AFM). This kind of characterization, combined with X-ray reflectivity measurements to assess the deep multilayer stack structure, can be used to model the layer roughening during the growth process via a well-known roughness evolution model. In this work, X-ray scattering measurements are performed and compared with simulations obtained from the modeled interfacial Power Spectral Densities (PSDs) and the modeled Crossed Spectral Densities for all the couples of interfaces. We already used this approach in a previous work for periodic multilayers; we now show how this method can be extended to graded multilayers. The upgraded code is validated for both periodic and graded multilayers, with a good accord between experimental data and model findings. Doing this, different kind of defects observed in AFM scans are included in the PSD analysis. The subsequent data-model comparison enables us to recognize them as surface contamination or interfacial defects that contribute to the X-ray scattering of the multilayer.
قيم البحث
اقرأ أيضاً
Future hard X-ray telescopes (e.g. SIMBOL-X and Constellation-X) will make use of hard X-ray optics with multilayer coatings, with angular resolutions comparable to the achieved ones in the soft X-rays. One of the crucial points in X-ray optics, inde
ed, is multilayer interfacial microroughness that causes effective area reduction and X-Ray Scattering (XRS). The latter, in particular, is responsible for image quality degradation. Interfacial smoothness deterioration in multilayer deposition processes is commonly observed as a result of substrate profile replication and intrinsic random deposition noise. For this reason, roughness growth should be carefully investigated by surface topographic analysis, X-ray reflectivity and XRS measurements. It is convenient to express the roughness evolution in terms of interface Power Spectral Densities (PSD), that are directly related to XRS and, in turn, in affecting the optic HEW (Half Energy Width). In order to interpret roughness amplification and to help us to predict the imaging performance of hard X-ray optics, we have implemented a well known kinetic continuum equation model in a IDL language program (MPES, Multilayer PSDs Evolution Simulator), allowing us the determination of characteristic growth parameters in multilayer coatings. In this paper we present some results from analysis we performed on several samples coated with hard X-ray multilayers (W/Si, Pt/C, Mo/Si) using different deposition techniques. We show also the XRS predictions resulting from the obtained modelizations, in comparison to the experimental XRS measurements performed at the energy of 8.05 keV.
One of the problems often encountered in X-ray mirror manufacturing is setting proper manufacturing tolerances to guarantee an angular resolution - often expressed in terms of Point Spread Function (PSF) - as needed by the specific science goal. To d
o this, we need an accurate metrological apparatus, covering a very broad range of spatial frequencies, and an affordable method to compute the PSF from the metrology dataset. [...] However, the separation between these spectral ranges is difficult do define exactly, and it is also unclear how to affordably combine the PSFs, computed with different methods in different spectral ranges, into a PSF expectation at a given X-ray energy. For this reason, we have proposed a method entirely based on the Huygens-Fresnel principle to compute the diffracted field of real Wolter-I optics, including measured defects over a wide range of spatial frequencies. Owing to the shallow angles at play, the computation can be simplified limiting the computation to the longitudinal profiles, neglecting completely the effect of roundness errors. Other authors had already proposed similar approaches in the past, but only in far-field approximation, therefore they could not be applied to the case of Wolter-I optics, in which two reflections occur in sequence within a short range. The method we suggest is versatile, as it can be applied to multiple reflection systems, at any X-ray energy, and regardless of the nominal shape of the mirrors in the optical system. The method has been implemented in the WISE code, successfully used to explain the measured PSFs of multilayer-coated optics for astronomic use, and of a K-B optical system in use at the FERMI free electron laser.
Photospheric radius expansion during X-ray bursts can be used to measure neutron star radii and help constrain the equation of state of neutron star matter. Understanding the stellar wind dynamics is important for interpreting observations. Stellar w
ind models, though studied in past decades, have thus regained interest and need to be revisited with updated data and methods. In this work we study the radiative wind model in the context of XRBs, with modern techniques and physics input. We focus on characterization of the solutions and study of observable magnitudes as a function of free model parameters. We implement a spherically-symmetric non-relativistic wind model in a stationary regime, with updated opacity tables and modern numerical techniques. Total mass and energy outflows $(dot M,dot E)$ are treated as free parameters. A high resolution parameter space exploration was performed to allow better characterization of observable magnitudes. High correlation was found between different photospheric magnitudes and free parameters. For instance, the photospheric ratio of gravitational energy outflow to radiative luminosity is in direct proportion to the photospheric wind velocity. The correlations found could help determine the physical conditions of the inner layers, where nuclear reactions take place, by means of observable photospheric values. Further studies are needed to determine the range of physical conditions in which the correlations are valid.
The Solar Corona Imager is an internally occulted coronagraph on board the ASO-S mission, which has the advantage of imaging the inner corona in H I {Lyman-textalpha} (Ly-alpha) and white-light (WL) wavebands. However, scattering of solar disk light
by the primary mirror (M1) becomes the main source of stray light. To study the methods of stray light suppression, three scattering models are used to model M1 scattering in Zemax OpticStudio. The ratio of coronal emission to predicted stray light decrease along field of view in both channels. The stray light in Ly-alpha channel is generally lower than coronal emission, but the stray light in WL channel tends to be one order of magnitude higher than coronal signal at 2.5 Rsun. Optimized parameter combinations that suppress the stray light to required level are obtained, which put some limitations on the M1 manufacture. Besides, K-correlation model is recommended to simulate surface scattering.
High frequency quasi-periodic oscillations (QPOs) from weakly magnetized neutron stars display rapid frequency variability and high coherence with quality factors up to at least 200 at frequencies around 850 Hz. Their parameters have been estimated s
o far from standard min(chi2) fitting techniques, after combining a large number of Power Density Spectra (PDS), as to have the powers normally distributed. Accounting for the statistical properties of PDS, we apply a maximum likelihood method to derive the QPO parameters in the non Gaussian regime. The method presented is general, easy to implement and can be applied to fitting individual PDS, several PDS simultaneously or their average, and is obviously not specific to the analysis of kHz QPO data. It applies to the analysis of any PDS optimized in frequency resolution and for low frequency variability or PDS containing features whose parameters vary on short timescales, as is the case for kHz QPOs. It is equivalent to the standard chi^2 minimization fitting when the number of PDS fitted is large. The accuracy, reliability and superiority of the method is demonstrated with simulations of synthetic PDS. We show that the maximum likelihood estimates of the QPO parameters are asymptotically unbiased, and have negligible bias when the QPO is reasonably well detected. By contrast, we show that the standard min(chi2) fitting method gives biased parameters with larger uncertainties. The maximum likelihood fitting method is applied to a subset of archival Rossi X-ray Timing Explorer (RXTE) data of the neutron star X-ray binary 4U1608-522. We show that the kHz QPO parameters can be measured on 8 second timescales and that the time evolution of the frequency is consistent with a random walk. This enables us to estimate the intrinsic quality factor of the QPO to be around 260, whereas previous analysis indicated a maximum value around 200 (abridged).
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
