ﻻ يوجد ملخص باللغة العربية
Multiferroic BiFeO3 (BFO) thin film exhibiting desired ferroelectric and enhanced magnetic properties was grown on La0.67Sr0.33MnO3 (LSMO) buffered Pt/TiO2/SiO2/Si substrates by off-axis RF magnetic sputtering, where a highly (111)-oriented texture was obtained. The BFO/LSMO thin film exhibits excellent ferroelectric and dielectric behaviors (2Pr ~210.7 {mu}C/cm2, 2Ec~435 kV/cm, {epsilon}r ~116.8, and tan{delta} ~ 2.7% at 1 kHz), together with a long fatigue endurance up to 1010 switching cycles at amplitude of 300 kV/cm. An enhancement in magnetic behavior was also observed with Ms=89.5 emu/cm3, which is largely contributed from the magnetic layer of LSMO. The coexistence of ferroelectric and ferromagnetic properties in the double layered BFO/LSMO thin film makes it a promising candidate system for applications where the magnetoelectric behavior is required.
Growth of perovskite oxide thin films on Si in crystalline form has long been a critical obstacle for the integration of multifunctional oxides into Si-based technologies. In this study, we propose pulsed laser deposition of a crystalline SrTiO3 thin
We report a detailed study of surface and interface properties of pulsed-laser deposited NiMnSb films on Si (100) substrate as a function of film thickness. As the thickness of films is reduced below 35 nm formation of a porous layer is observed. Por
Strain engineering with different substrate facets is promising for tuning functional properties of thin film perovskite oxides. By choice of facet, different surface symmetries and chemical bond directions for epitaxial interfaces can be tailored. H
BiFeO3 thin films have been deposited on Pt/sapphire and Pt/Ti/SiO2/Si substrates with pulsed laser deposition using the same growth conditions, respectively. Au was sputtered as the top electrode. The microscopic structure of the thin film varies by
BiFeO3 thin films with various thicknesses were grown epitaxially on (001) LaSrAlO4 single crystal substrates using pulsed laser deposition. High resolution x-ray diffraction measurements revealed that a tetragonal-like phase with c-lattice constant