We present a general theory of current deviations in straight current carrying wires with random imperfections, which quantitatively explains the recent observations of organized patterns of magnetic field corrugations above micron-scale evaporated wires. These patterns originate from the most efficient electron scattering by Fourier components of the wire imperfections with wavefronts along the $pm 45^{circ}$ direction. We show that long range effects of surface or bulk corrugations are suppressed for narrow wires or wires having an electrically anisotropic resistivity.
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