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تسجيل مستخدم جديدModelling Thickness-Dependence of Ferroelectric Thin Film Properties
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We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a smoking gun benchtop probe to test our elastic scenario.
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